|1Gaidar, GP |
1Institute for Nuclear Research of the NAS of Ukraine, Kyiv
|Dopov. Nac. akad. nauk Ukr. 2018, 6:58-66|
Specific features of variations in the electrophysical parameters and microstructure of n-Ge single crystals doped with the arsenic impurity that occur during thermal annealings in a wide temperature range are established. The obtained dependences of the concentration and mobility of charge carriers on the annealing temperature are explained by the processes of restructuring of impurity complexes in the strongly doped germanium crystals grown by the Czochralski method.
|Keywords: arsenic impurity, charge carrier concentration, charge carrier mobility, germanium, heavy doping, microstructure, thermal annealings|
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